Diffraction of evanescent waves and nanomechanical displacement detection.
نویسندگان
چکیده
Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.
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ورودعنوان ژورنال:
- Optics letters
دوره 32 13 شماره
صفحات -
تاریخ انتشار 2007